BS EN 153000:1998

Applies to rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies but not to stacks or assemblies made with these encapsulated components.

Cross References:
CECC 00007
CECC 00111
EN 100114-1
EN 100114-2
IEC 60027
IEC 60050
IEC 60068-1
IEC 60068-2-2
IEC 60068-2-6
IEC 60068-2-14
IEC 60068-2-17
IEC 60148
IEC 60191
IEC 60410
IEC 60617
IEC 60747-2
IEC 60747-6
ISO 497
ISO 1000
ISO/R 2015




Keywords: Semiconductor devices; Electronic equipment and components; Thyristors; Transistors; Rectifier diodes; Encapsulated; Qualification approval; Approval testing; Conformity; Assessed quality ; Detail specification; Visual inspection (testing); Quality assurance ; Quality assurance systems; Electrical testing; Non-destructive testing ; Marking; Dimensions; Environmental testing; Endurance testing ; Leak tests

Product Code(s): 01453186,01453186

This product references:IEC 60068-2-2 Ed. 4.0 b:1974 - Environmental testing - Part 2: Tests. Tests B: Dry heat
IEC 60068-2-6 Ed. 6.0 b:1995 - Environmental testing - Part 2: Tests - Test Fc: Vibration (sinusoidal)
IEC 60068-2-14 Ed. 5.0 b:1984 - Environmental testing - Part 2: Tests. Test N: Change of temperature
IEC 60068-1 Ed. 6.0 b:1988 - Environmental testing. Part 1: General and guidance
IEC 60747-6 Ed. 2.0 b:2000 - Semiconductor devices - Part 6: Thyristors
IEC 60068-2-17 Ed. 4.0 b:1994 - Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60410 Ed. 1.0 b:1973 - Sampling plans and procedures for inspection by attributes
IEC 60747-2 Ed. 2.0 b:2000 - Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes
ISO 497:1973 - Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers
ISO 1000:1992 - SI units and recommendations for the use of their multiples and of certain other units