BS CECC 50000:1987

Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests and screening.

Cross References:
BS 2011
BS 2045
BS 3363
BS 3934
BS 3939
BS 4727
BS 4760
BS 5555
BS 5775
BS 6001
BS 9000:Part 2
BS 9300
BS E9007
IEC 134
BS 9000:Part 1
IEC 68-1
IEC 68-2-2
IEC 68-2-2A
IEC 68-2-3
IEC 68-2-6
IEC 68-2-7
IEC 68-2-14
IEC 68-2-17
IEC 68-2-20
IEC 68-2-21
IEC 68-2-27
IEC 68-2-38
IEC 68-2-45
CECC 00102
CECC 00103
CECC 00106
CECC 00107
CECC 00108
CECC 00109
CECC 00110
CECC 00111
CECC 00112
CECC 00113


Replaces BS 9300:1969 which remains current due to existing approvals.



Keywords: Semiconductor devices; Semiconductor diodes; Semiconductor rectifiers ; Transistors; Thyristors; Electronic equipment and components; Quality assurance systems; Assessed quality; Qualification approval; Marking; Colour codes; Designations; Sampling methods; Testing conditions; Electrical testing; Environmental testing; Mechanical testing; Orientation; Leak tests; Endurance testing; Statistical quality control; Quality control; Electrical measurement; Breakdown voltage; Voltage measurement; Test equipment; Circuits; Performance testing; Transient voltages; Power measurement (electric); Noise (spurious signals); Current measurement; Capacitance measurement; Visual inspection (testing); Approval testing; Inspection; Specification (approval); Capability approval; Acceptance (approval); Thermal testing; Accelerated testing; Heat of activation

Product Code(s): 00172970,00172970

This product replaces:BS 9300:1969 - Specification for semiconductor devices of assessed quality: generic data and methods of test