BS EN 120000:1996

Specifies quality assessment procedures,test methods and terminology required in the preparation of detailed specifications for optoelectronic and liquid crystal devices.

Cross References:
BS 2011:Part 2.1 Ca
BS 2011:Part 2.1 Db
BS 2011:Part 2.1N
BS 2011:Part 2.1T
BS 2011:Part 2.1U
BS 2011:Part 2.1Z/AD
BS 2045
BS 2754
BS 3363
BS 3934
BS 3939
BS 4828
BS 5555
BS 6000:Part 1
BS 6493:Part 1:Section 1.1
BS 6493:Part 1:Section 1.2
BS 6493:Part 1:Section 1.5
BS CECC 00109
BS CECC 00114
BS EN ISO 9000
BS EN 60065
BS EN 60068-1
BS EN 60068-2-2
BS EN 60068-2-6
BS EN 60068-2-7
BS EN 60068-2-17
BS EN 60068-2-27
IEC 27
IEC 134
CECC 00007
CECC 00100
ISO/R 2015
CENELEC HD 245




Keywords: Optoelectronic devices; Semiconductor devices; Liquid crystal devices ; Electronic equipment and components; Quality assurance systems; Quality control; Statistical quality control; Assessed quality; Qualification approval; Approval testing; Inspection; Visual inspection (testing) ; Specification (approval); Capability approval; Marking; Designations; Sampling methods; Environmental testing; Mechanical testing; Endurance testing; Optical measurement; Test equipment; Circuits; Defects; Performance testing; Light distribution; Electrical testing; Electrical measurement; Voltage measurement; Current measurement; Resistance measurement; Light-emitting devices; Light-emitting diodes; Photodiodes; Phototransistors; Couplers; Testing conditions; Verification; Detail specification; Handbooks

Product Code(s): 00824417,00824417

This product replaces:BS CECC 20000:1983 - Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices